AD677KNZ

AD677KNZ is a multipurpose 16bit serial output analogue-to-digital converter that utilizes a switched-capacitor/charge redistribution architecture to achieve a 100kSPS conversion rate (10µs total conversion time). Overall performance is optimized by digitally correcting internal nonlinearities through on-chip auto-calibration. This device circuitry is segmented onto two monolithic chips a digital control chip fabricated on Analog Devices DSP CMOS process and an analogue ADC chip fabricated on our BiMOS II process. It is specified for ac (or “dynamic”) parameters such as S/(N+D) Ratio, THD, and IMD which are important in signal processing applications. In addition, dc parameters are specified which are important in measurement applications. An analogue ground sense is provided to remotely sense the ground potential of the signal source. This can be useful if the signal has to be carried some distance to the A/D converter. Separate analogue and digital grounds are also provided.

• Auto calibrating, on-chip sample-hold function
• Total harmonic distortion is -99dB typical at ( 100kSPS, +25°C)
• Signal-to-noise and distortion ratio is 92dB typical at (100kSPS, +25°C)
• Full power bandwidth is 1MHz typical at (VCC = +12V ±5%, VEE = -12V ±5%)
• Integral nonlinearity is +1LSB typical at (100kSPS, +25°C)
• Input settling time is 2µs typical at (VCC = +12V ±5%, VEE = -12V ±5%)
• Aperture jitter is 100ps typical at (VCC = +12V ±5%, VEE = -12V ±5%)
• Power consumption is 450mW typical at (VCC = +12V ±5%, VEE = -12V ±5%)
• Noise is 160µV rms typical at (VCC = +12V ±5%, VEE = -12V ±5%)
• Operating temperature range from 0°C to +70°C, 16-pin plastic DIP package

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