ADR444BRZ

ADR444 is an ultralow noise, LDO XFET voltage reference with current sink and source. This voltage reference features ultralow noise, high accuracy and low temperature drift performance. Using Analog Devices, Inc., temperature drift curvature correction and extra implanted junction FET (XFET) technology, voltage change vs. temperature nonlinearity in this device is greatly minimized. XFET references offer better noise performance than buried zener references and XFET references operate off low supply voltage headroom (500mV). This combination of features makes device ideally suited for precision signal conversion applications in high end data acquisition systems, optical networks and medical applications. Applications include precision data acquisition systems, high resolution data converters, battery-powered instrumentation, portable medical instruments, industrial process control systems, precision instruments and optical control circuits.

• Supply voltage operating range from 4.6V to 18V
• High output source and sink current +10mA and −5mA, respectively
• Typical output voltage of 4.096V, initial accuracy of ±1.6mV/0.04% max (VIN=4.6V to 18V, TA=25°C)
• Temperature coefficient of 3ppm/°C max at -40°C <lt/> TA <lt/> +125°C
• Ripple rejection ratio of −80dB at fIN = 1KHz, VIN = 4.6V to 18V, TA = 25°C
• Voltage noise of 1.8µV p-p at 0.1Hz to 10Hz, VIN = 4.6V to 18V, TA = 25°C
• Turn on settling time of 10µs at VIN = 4.6V to 18V, TA = 25°C
• Line regulation of +20ppm/V max (−40°C <lt/> TA <lt/> +125°C)
• Load regulation of ±50ppm/mA (ILOAD = 0mA to −5mA, VIN = 5.5V, −40°C <lt/> TA <lt/> +125°C)
• 8-lead SOIC-N package, -40°C to +125°C temperature range

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